Strength, Hardening, and Failure Observed by In Situ TEM Tensile Testing
نویسندگان
چکیده
منابع مشابه
Strength, Hardening, and Failure Observed by In Situ TEM Tensile Testing**
We present in situ transmission electron microscope tensile tests on focused ion beam fabricated single and multiple slip oriented Cu tensile samples with thicknesses in the range of 100-200 nm. Both crystal orientations fail by localized shear. While failure occurs after a few percent plastic strain and limited hardening in the single slip case, the multiple slip samples exhibit extended homog...
متن کاملQuantitative fracture strength and plasticity measurements of lithiated silicon nanowires by in situ TEM tensile experiments.
We report in situ tensile strength measurement of fully lithiated Si (Li-Si alloy) nanowires inside a transmission electron microscope. A specially designed dual probe with an atomic force microscopy cantilever and a scanning tunneling microscopy electrode was used to conduct lithiation of Si nanowires and then perform in situ tension of the lithiated nanowires. The axial tensile strength decre...
متن کاملSource Truncation and Exhaustion: Insights from Quantitative in situ TEM Tensile Testing
A unique method for quantitative in situ nanotensile testing in a transmission electron microscope employing focused ion beam fabricated specimens was developed. Experiments were performed on copper samples with minimum dimensions in the 100-200 nm regime oriented for either single slip or multiple slip, respectively. We observe that both frequently discussed mechanisms, truncation of spiral di...
متن کاملQuantitative in situ TEM tensile testing of an individual nickel nanowire.
In this paper, we have demonstrated the usage of a novel micro-mechanical device (MMD) to perform quantitative in situ tensile tests on individual metallic nanowires inside a transmission electron microscope (TEM). Our preliminary experiment on a 360 nm diameter nickel nanowire showed that the sample fractured at an engineering stress of ∼ 1.2 GPa and an engineering strain of ∼ 4%, which is con...
متن کاملCorrection: Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films.
The authors have found an error in the post-processing scheme to calculate the stress–strain curves from the raw electrical data (ΔC1 − ΔC2 vs. Vin, with and without the specimen). The scheme consists of calculating X A (using eqn (6)), from which ΔC1 is known (using eqn (1)). ΔC2 is then determined knowing the measured ΔC1 − ΔC2 value, from which XLS can be determined using eqn (1). The calibr...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Advanced Engineering Materials
سال: 2012
ISSN: 1438-1656
DOI: 10.1002/adem.201200031